Metre (unit)/Bibliography
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- Please sort and annotate in a user-friendly manner. For formatting, consider using automated reference wikification.
- Description of how the known silicon lattice spacing can be used to set up the wavelength of Mössbauer radiation as a convenient length standard at atomic scales. Yu V Shvyd'ko et al. (2000). "γ-ray wavelength as standard for atomic scales". Phys Rev Lett vol 85: pp. 495-498. DOI:10.1103/PhysRevLett.85.495. Research Blogging.
- An interesting discussion of interferometric methods and instruments. J Schmit, K Creath, and JC Wyant (2007). “Chapter 15: Surface profilers, multiple wavelength, and white light interferometry”, Daniel Malacara, ed.: Optical shop testing, 3rd ed. Wiley-Interscience, pp. 667 ff. ISBN 0471484040.
- A thorough discussion of metrology of the metre. J Flügge, F Riehle, and H Kunzmann (2004). “Chapter D2.1: Fundamental length metrology”, Colin E. Webb, Julian D. C. Jones, eds: Handbook of Laser Technology and Applications: Applications. Taylor & Francis, pp. 1723 ff. ISBN 0750309660.
- Discussion of metrological traceability for the interferometer and the atomic force microscope, among other techniques. (2009) Richard Leach, ed: Fundamental Principles of Engineering Nanometrology (Micro and Nano Technologies). Elsevier /William Andrew. ISBN 0080964540.